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  • Diodes

    As a transistor-level power integrity analysis solution, Empyrean Patron® features dynamic EM/IR, self-heating effect, and multi-state EM/IR analysis. It also features a lightweight, easy-to-configure, user-friendly, and visualized interface that supports layout back-annotation of all power integrity analysis results in an intuitive and fast fashion."Diodes has conducted an evaluation on Empyrean Patron®. It features a simple, user-friendly, and graphics interface for pre-configuration and result display. It runs much faster in the actual design than our current tool set. What's more, thanks to Empyrean Technology's existing simulation acceleration technology, the larger the size of our chips, the more remarkable the acceleration effect. Empyrean Patron® enables our engineers to quickly upload the analysis results to the built-in chip inspection platform for result highlighting and sorting. Its unique Probe On feature also facilitates users to prompt and display analysis results for review. These back-annotation features of the tool save our engineers time, give direct and visual message as compared to other legacy tools. As for service, we can get timely and efficient application support from Empyrean Technology's expert team  at any time."

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    As a transistor-level power integrity analysis solution, Empyrean Patron® features dynamic EM/IR, self-heating effect, and multi-state EM/IR analysis. It also features a lightweight, easy-to-configure, user-friendly, and visualized interface that supports layout back-annotation of all power integrity analysis results in an intuitive and fast fashion."Diodes has conducted an evaluation on Empyrean Patron®. It features a simple, user-friendly, and graphics interface for pre-configuration and result display. It runs much faster in the actual design than our current tool set. What's more, thanks to Empyrean Technology's existing simulation acceleration technology, the larger the size of our chips, the more remarkable the acceleration effect. Empyrean Patron® enables our engineers to quickly upload the analysis results to the built-in chip inspection platform for result highlighting and sorting. Its unique Probe On feature also facilitates users to prompt and display analysis results for review. These back-annotation features of the tool save our engineers time, give direct and visual message as compared to other legacy tools. As for service, we can get timely and efficient application support from Empyrean Technology's expert team  at any time."

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